Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...
The IoT represents a rapidly growing market for which high-speed wireless connections suitable for various usage systems are indispensable. The arrival of digital transportation is accelerating this ...
SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...
KTE 7-based S530 platform maximizes measurement performance and minimizes cost to help semiconductor manufacturers compete in high-growth emerging markets. Related To: Tektronix Tektronix released the ...
Operating at millimetRE-wave frequencies introduces a set of engineering challenges that extend far beyond traditional radio frequency testing ...
1. The traditional Excel spreadsheet approach to system-level will include analysis component mismatches and phase noise. 2. Here, the Visual System Simulator (VSS) is co-simulated with the Microwave ...
Traditional semiconductor testing typically involves tests executed by automatic test equipment (ATE). But engineers are beginning to favor an additional late-test pass that tests systems-on-chip ...
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