BALTIMORE — The prevalence and escalating cost of system-on-chip (SoC) designs are forcing a reexamination of existing approaches to design and test, according to EDA and test industry executives at a ...

Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...

TOKYO, Oct. 11, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced that IC testing laboratory iTest, Inc. has taken a delivery of ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...