Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...

A new solution deposition process for semiconductors yields high-performing transistors by introducing more defects, counterintuitively. Researchers used these devices to construct high- speed logic ...

A team of researchers at the University of Minnesota has developed a next-generation transparent and efficient semiconductor material. This breakthrough could have enormous ramifications for improving ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Nanoindenters are precise, adaptable, and user-friendly tools for performing nanoscale mechanical testing on various films and surfaces. Nanoindentation systems with electromagnetic actuation achieve ...

Cadmium selenide nanoplatelets provide a promising foundation for the development of innovative electronic materials. Researchers around the world have taken a particular interest in these tiny ...

While semiconductors remain in high demand, electronics engineers must stay abreast of associated developments that could eventually affect their work. Case in point: significant advancements in ...