This article is dedicated to Jim Williams who several years ago (2006) wrote an article in EDN regarding the need of a good lab apparatus to qualify the behavior of voltage regulators for compliance ...

A steady stream of advances has elevated test and measurement instruments to the point where they can reveal minute details of signals with lightning-quick rise and fall times. So, then, what about ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...