Michigan Technological University

FIB Form and Function 1

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
AZOM

Imaging Automation With Python-Based SEM and FIB SEM Software

Thermo Scientific Auto Slice and View and Maps, two automation software packages for electron/ion microscopy, are excellent for simplifying gathering common imaging techniques. However, it is rarely ...
AZOM

Characterizing Li-Ion Battery Components Using FIB-SEM Tomography

A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...