Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Have you ever designed a product that you thought was ready to ship only to have it fail testing by not meeting safety requirements? Months can be lost and mistakes repeated if a company doesn’t have ...

If your circuit design has requirements to be tolerant to certain faults and to report their occurrence, you’ll need to test the fault detection and protection features of your design during the test ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...

Testing microprocessors is becoming more difficult and more time consuming as these devices are designed to take on more complex tasks, such as accelerating artificial intelligence computing, enabling ...